Environmental Contamination Sources and Control in High Resolution Scanning Electron Microscopy
نویسندگان
چکیده
منابع مشابه
Scanning transmission electron microscopy at high resolution.
We have shown that a scanning transmission electron microscope with a high brightness field emission source is capable of obtaining better than 3 A resolution using 30 to 40 keV electrons. Elastic dark field images of single atoms of uranium and mercury are shown which demonstrate this fact as determined by a modified Rayleigh criterion. Point-to-point micrograph resolution between 2.5 and 3.0 ...
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In the present study, pathogenicity of four native strains of Entomopathogenic fungus; Metarhizium anisopliae, was studied against adult stage of Ixodes ricinus. For this purpose a total number of 180 adult ticks were examined in triplicate. Thirty ticks for each strain and negative and positive controls were immersed in 2.4×107 fungal conidia/ml in vitro. Samples were incubated in separate Pet...
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Ultrastructural analysis of cells can reveal valuable information about their morphological, physiological, and biochemical characteristics. Scanning electron microscopy (SEM) has been widely used to provide high-resolution images from the surface of biological samples. However, samples need to be dehydrated and coated with conductive materials for SEM imaging. Besides, immobilizing non-adheren...
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During the past two decades instrumentation in scanning transmission electron microscopy (STEM) has pushed toward higher intensity electron probes to increase the signal-to-noise ratio of recorded images. While this is suitable for robust specimens, biological specimens require a much reduced electron dose for high-resolution imaging. We describe here protocols for low-dose STEM image recording...
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ژورنال
عنوان ژورنال: Microscopy and Microanalysis
سال: 2005
ISSN: 1431-9276,1435-8115
DOI: 10.1017/s1431927605501661